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Yashwant K. Malaiya

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1998 IEEE International Workshop on IDDQ Testing: Proceedings : November 12-13, 1998, San Jose, California

by IEEE International Workshop on IDDQ Test..., California) IEEE International Workshop ..., Sankaran M. Menon, and Yashwant K. Malaiya First published in 1998 — 3 editions

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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

by IEEE International Workshop on Defect Ba..., Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, and Quebec) IEEE VLSI Test Symposium (2000 :... First published in 2000 — 2 editions

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Bridging faults and IDDQ testing

by Yashwant K. Malaiya and Rochit Rajsuman First published in 1992 — 1 edition

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OLID: OL2853776A

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Created April 29, 2008
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