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![Cover of: Machine vision and three-dimensional imaging systems for inspection and metrology: 6-8 November 2001 [i.e. 2000], Boston, USA](http://covers.openlibrary.org/b/id/14354854-M.jpg "Cover of: Machine vision and three-dimensional imaging systems for inspection and metrology: 6-8 November 2001 [i.e. 2000], Boston, USA")
Subjects
Congresses, Industrial applications, Measurement, Optical measurements, Optical methods, Three-dimensional display systems, Engineering inspection, Quality control, Computer vision, Lasers, Imaging systems, Metrology, Optical detectors, Mensuration, Optical instruments, Triangulation, Interferometry, Three-dimensional imaging, Electrooptical devices, Image processing, Image processing, digital techniques, Lasers, industrial applications, Measuring instruments, Mesures optiques, Moire topographyID Numbers
- OLID: OL3617991A
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| April 30, 2008 | Created by an anonymous user | initial import |