An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced Vlsi Design and Testability Issues

by , , and

Cover of: Advanced Vlsi Design and Testability Issues by Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra, Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
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Last edited by ImportBot
April 11, 2023 | History
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An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced Vlsi Design and Testability Issues

by , , and

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Publish Date
Publisher
Taylor & Francis Group, CRC Press
Language
English
Pages
378

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Subjects

Integrated circuits, Very large scale integration, Design and construction, TECHNOLOGY, Electricity, Electronics, Circuits, General
Edition Availability
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2022, Taylor & Francis Group
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Cover of: Advanced Vlsi Design and Testability Issues
Advanced Vlsi Design and Testability Issues
2020, Taylor & Francis Group, CRC Press
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English

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Book Details

Classifications

Library of Congress
TK7874.75

The Physical Object

Pagination
360
Number of pages
378

Edition Identifiers

Open Library
OL34674063M
ISBN 13
9780367492823

Work Identifiers

Work ID
OL21690268W

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Better World Books record
amazon.com record

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History

Download catalog record: RDF / JSON
April 11, 2023 Edited by ImportBot import existing book
December 16, 2022 Edited by MARC Bot import existing book
August 26, 2020 Created by ImportBot import new book