Pattern Analysis and Machine Intelligence

First International Conference, ICPAMI 2024, Shanghai, China, August 30-September 1, 2024, Proceedings

Pattern Analysis and Machine Intelligence
Jie Yang, Yuanjie Zheng, Chen ...
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February 17, 2025 | History

Pattern Analysis and Machine Intelligence

First International Conference, ICPAMI 2024, Shanghai, China, August 30-September 1, 2024, Proceedings

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Publish Date
Publisher
Springer
Language
English
Pages
500

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Library of Congress
TA1634

Edition Identifiers

Open Library
OL57744904M
ISBN 13
9789819633487

Work Identifiers

Work ID
OL42542477W

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