An edition of Defect-oriented testing for nano-metric CMOS VLSI circuits (2007)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev, José Pineda de Gyvez, Manoj Sachdev, José Pineda de Gyvez
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Last edited by ImportBot
September 11, 2021 | History
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An edition of Defect-oriented testing for nano-metric CMOS VLSI circuits (2007)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Publish Date
Publisher
Springer
Pages
328

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Subjects

Complementary Metal oxide semiconductors, Very large scale integration, Testing, Defects, Integrated circuits, Integrated circuits, very large scale integration, Metal oxide semiconductors, complementary
Edition Availability
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
June 21, 2007, Springer
in English
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English

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Book Details

Edition Notes

Source title: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Classifications

Library of Congress
TK7888.4TK1-9971TA17

The Physical Object

Format
paperback
Number of pages
328

Edition Identifiers

Open Library
OL28737076M
ISBN 10
1441942858
ISBN 13
9781441942852

Work Identifiers

Work ID
OL19840609W

Source records

amazon.com record
Better World Books record

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
September 11, 2021 Edited by ImportBot import existing book
August 14, 2020 Created by ImportBot Imported from amazon.com record