An edition of Nanometer-Scale Defect Detection Using Polarized Light
(2016)
Nanometer-Scale Defect Detection Using Polarized Light
by Pierre-Richard Dahoo, Philippe Pougnet, and Abdelkhalak El Hami
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Chemical processes| Edition | Availability |
|---|---|
1
Nanometer-Scale Defect Detection Using Polarized Light
2016, Wiley & Sons, Incorporated, John
in English
1848219369 9781848219366
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2
Nanometer-Scale Defect Detection Using Polarized Light
2016, Wiley & Sons, Incorporated, John
in English
1119329655 9781119329657
|
zzzz
|
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3
Nanometer-Scale Defect Detection Using Polarized Light
2016, Wiley & Sons, Incorporated, John
in English
1119329639 9781119329633
|
zzzz
|
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4
Nanometer-Scale Defect Detection Using Polarized Light
2016, Wiley & Sons, Incorporated, John
in English
111932968X 9781119329688
|
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- Created August 24, 2020
- 1 revision
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| August 24, 2020 | Created by ImportBot | Imported from Better World Books record |