Semiconductor measurements and instrumentation

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Last edited by MARC Bot
December 7, 2022 | History

Semiconductor measurements and instrumentation

  • 2 Want to read

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Publish Date
Publisher
McGraw-Hill
Language
English
Pages
280

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Previews available in: English

Edition Availability
Cover of: Semiconductor measurements and instrumentation
Semiconductor measurements and instrumentation
1998, McGraw Hill
in English - 2nd ed.
Cover of: Semiconductor measurements and instrumentation
Cover of: Semiconductor measurements and instrumentation
Semiconductor measurements and instrumentation
1975, McGraw-Hill
in English

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Book Details


Edition Notes

Includes bibliographical references and index.

Published in
New York
Series
Texas Instruments electronics series

Classifications

Dewey Decimal Class
537.6/22
Library of Congress
QC611.24 .R86

The Physical Object

Pagination
vii, 280 p. :
Number of pages
280

Edition Identifiers

Open Library
OL5196752M
ISBN 10
0070542732
LCCN
75019035
OCLC/WorldCat
1504882
LibraryThing
3367264
Goodreads
4279610

Work Identifiers

Work ID
OL2690837W

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 7, 2022 Edited by MARC Bot import existing book
October 8, 2020 Edited by MARC Bot import existing book
June 6, 2011 Edited by 109.74.232.226 Edited without comment.
August 4, 2010 Edited by IdentifierBot added LibraryThing ID
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record