An edition of Nanostructure science, metrology, and technology (2002)

Nanostructure science, metrology, and technology

5-7 September 2001, Gaithersburg, USA

by

Cover of: Nanostructure science, metrology, and technology by Michael T. Postek
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Last edited by ImportBot
August 1, 2020 | History
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An edition of Nanostructure science, metrology, and technology (2002)

Nanostructure science, metrology, and technology

5-7 September 2001, Gaithersburg, USA

by

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Publish Date
Publisher
SPIE-the International Society for Optical Engineering
Language
English
Pages
278

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Previews available in: English

Subjects

Metrology, Nanotechnology, Congresses, Nanostructures, Microelectronics, Measurement
Edition Availability
Cover of: Nanostructure science, metrology, and technology
Nanostructure science, metrology, and technology: 5-7 September 2001, Gaithersburg, USA
2002, SPIE-the International Society for Optical Engineering
in English

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Book Details

Edition Notes

Includes bibliographical references and indexes.
"Sponsored by SPIE-the International Society for Optical Engineering, National Institute of Standards and Technology (USA), Office of Naval Research (USA)."

Published in
Bellingham, Wash
Series
SPIE proceedings series,, v. 4608, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4608.
Genre
Congresses.

Classifications

Dewey Decimal Class
620/.5
Library of Congress
T174.7 .N359 2002, T174.7.N359 2002, T174.7 .N365 2002

The Physical Object

Pagination
x, 278 p. :
Number of pages
278

Edition Identifiers

Open Library
OL3702287M
ISBN 10
0819443476
LCCN
2003268907
OCLC/WorldCat
50514238
Goodreads
4282686

Work Identifiers

Work ID
OL19159691W

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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History

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August 1, 2020 Edited by ImportBot import existing book
March 10, 2019 Created by MARC Bot import existing book