Michael T. Postek

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Integrated Circuit Metrology, Inspection, And Process Control VII

by Michael T. Postek First published in 1993 — 3 editions

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Critical Issues in Scanning Electron Microscope Metrology: September-October 1994

by Michael T. Postek First published in 1994 — 1 edition

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Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California (Proceedings of S P I E)

by Michael T. Postek First published in 1992 — 1 edition

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Scanning Microscopies 2015

by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and Tim Maugel First published in 2015 — 1 edition

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Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States

by Michael T. Postek First published in 2011 — 1 edition

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Nanostructure science, metrology, and technology: 5-7 September 2001, Gaithersburg, USA

by Michael T. Postek First published in 2002 — 1 edition

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Scanning electron microscopy: a student's handbook

by Michael T. Postek and A. H. Johnson First published in 1980 — 1 edition

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Scanning microscopy 2010: 17-19 May 2010, Monterey, California, United States

by Michael T. Postek First published in 2010 — 1 edition

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Instrumentation, metrology, and standards for nanomanufacturing III: 3-5 August 2009, San Diego, California, United States

by Michael T. Postek First published in 2009 — 1 edition

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Instrumentation, metrology, and standards for nanomanufacturing II: 10 August 2008, San Diego, California, USA

by Michael T. Postek First published in 2008 — 1 edition

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Instrumentation, metrology, and standards for nanomanufacturing III: 3-5 August 2009, San Diego, California, United States

by Michael T. Postek First published in 2009 — 1 edition

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Instrumentation, metrology, and standards for nanomanufacturing IV: 2-4 August 2010, San Diego, California, United States

by Michael T. Postek First published in 2010 — 1 edition

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Scanning microscopy 2009: 4-7 May 2009, Monterey, California, United States

by Michael T. Postek First published in 2009 — 1 edition

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Scanning microscopy 2009: 4-7 May 2009, Monterey, California, United States

by Michael T. Postek First published in 2009 — 1 edition

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Microlithography and metrology in micromachining: 23-24 October, 1995, Austin, Texas

by Michael T. Postek First published in 1995 — 1 edition
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Microlithography and metrology in micromachining II: 14-15 October, 1996, Austin, Texas

by Michael T. Postek First published in 1996 — 1 edition

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Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

by Michael T. Postek, Dale E. Newbury, S. Frank Platek, David C. Joy, and Tim K. Maugel First published in 2012 — 1 edition

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New research in nanotechnology

by Michael T. Postek, Joseph Kopanski, and David Wollman First published in 2011 — 1 edition

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Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V: 24-25 August 2011, San Diego, California, United States

by Michael T. Postek and Victoria Anne Coleman First published in 2011 — 1 edition

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OLID: OL3545047A

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Created April 30, 2008
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April 30, 2008

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Michael T. Postek

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