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David C. Joy

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Introduction to Electron Holography

by Edgar Völkl, Lawrence F. Allard, and David C. Joy First published in 2011 — 3 editions

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Helium Ion Microscopy: Principles and Applications

by David C. Joy First published in 2013 — 2 editions

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Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

by Michael T. Postek, Dale E. Newbury, S. Frank Platek, David C. Joy, and Tim K. Maugel First published in 2012 — 1 edition

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, and Dale E. Newbury First published in 1986 — 1 edition

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OLID: OL7887053A

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Created May 13, 2020
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