An edition of Defect-oriented testing for nano-metric CMOS VLSI circuits (2007)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) by Manoj Sachdev, José Pineda de Gyvez, Manoj Sachdev, José Pineda de Gyvez
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Last edited by ImportBot
September 11, 2021 | History
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An edition of Defect-oriented testing for nano-metric CMOS VLSI circuits (2007)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by and

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Publish Date
Publisher
Springer
Language
English
Pages
328

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Subjects

Complementary Metal oxide semiconductors, Very large scale integration, Testing, Defects, Integrated circuits, Integrated circuits, very large scale integration, Metal oxide semiconductors, complementary
Edition Availability
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
June 21, 2007, Springer
in English

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Book Details

Classifications

Library of Congress
TK7888.4TK1-9971TA17, TK7871.99.M44 S23 2007

Edition Identifiers

Open Library
OL7445893M
ISBN 10
0387465464
ISBN 13
9780387465463
OCLC/WorldCat
79447484
LibraryThing
6363014
Goodreads
5028072

Work Identifiers

Work ID
OL19840609W

Source records

Internet Archive item record
Better World Books record
marc_columbia MARC record

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Download catalog record: RDF / JSON
September 11, 2021 Edited by ImportBot import existing book
September 10, 2021 Edited by ImportBot import existing book
June 29, 2019 Created by MARC Bot import existing book