An edition of Critical Issues in Scanning Electron Microscope Metrology
(1994)
Critical Issues in Scanning Electron Microscope Metrology
September-October 1994
Spiral edition
by Michael T. Postek
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April 28, 2010 | History
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| Edition | Availability |
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1
Critical Issues in Scanning Electron Microscope Metrology: September-October 1994
June 1994, Diane Pub Co
Plastic comb
in English
- Spiral edition
0788115529 9780788115523
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| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| December 11, 2009 | Created by WorkBot | add works page |